GB/T 4855-1984
Abolished
T/CESA 1120-2020
Active
Group standards
T/CESA 1120-2020 Artificial Intelligence Chip Test Indicators and Test Methods for Deep Learning Chips Oriented towards the Edge Side
T/CESA 1120-2020 Artificial intelligence chips for edge-side deep learning chip testing indicators and testing methods
Price:
$ 20.00
Basic Information
Standard Code:
T/CESA 1120-2020
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Computer
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2020-10-30
Implement Date:
2020-11-10
Scope
Main technical content: This document specifies the test indicators, test methods, and requirements for functional and performance testing of edge-side deep learning chips, and is applicable to edge-side deep learning chips. This document only stipulates the general principles of benchmark testing for edge-side deep learning chips. This document is suitable for third-party institutions to conduct performance testing and evaluation of edge-side deep learning chips, and is also applicable to the procurement and design of edge-side deep learning chip products. Edge-side chips do not necessarily need to have training capabilities.
Development Information
Related Standards
GB/T 3434-1986
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GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished