JJF 1351-2012 Active National Metrology Technical Specifications JJF

JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes

JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes

Publish Date: 2012-06-18 Implement Date: 2012-09-18 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: JJF 1351-2012
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: -
ICS Name: -
Publish Date: 2012-06-18
Implement Date: 2012-09-18
Pages: 20 pages

Scope

This specification applies to the calibration of scanning probe microscopes that use the morphology of geometric surfaces as the measurement object.
Depending on the design principle of the scanning probe microscope, the relevant metrological characteristics need to be selected according to the actual situation during calibration. Measurement tasks with special requirements, such as measurements with high traceability requirements, are not within the scope of application of this calibration specification.

Development Information

Word Count: 25 Thousand words Pages: 20 pages

Referenced Standards

Related Standards

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