GB/T 4855-1984
Abolished
GB/T 35007-2018
Active
National standards
GB/T 35007-2018 Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
GB/T 35007-2018 Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
Basic Information
Standard Code:
GB/T 35007-2018
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2018-03-15
Implement Date:
2018-08-01
Pages:
36 pages
Scope
This standard specifies the basic principles of the test methods for the static and dynamic parameters of semiconductor integrated circuits with low-voltage differential signaling (LVDS) circuits (hereinafter referred to as "devices"). This standard is applicable to the testing of the static and dynamic parameters of low-voltage differential signaling circuits.
Development Information
Referenced Standards
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished