GB/T 7288.1-1987
Abolished
T/WXIOT 002-2023
Active
Group standards
T/WXIOT 002-2023 Physical destructive analysis method for semiconductor discrete devices used in automobiles
T/WXIOT 002-2023 Physical destructive analysis method for semiconductor discrete devices used in automobiles
Price:
$ 49.00
Basic Information
Standard Code:
T/WXIOT 002-2023
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
The experimental conditions and procedures are summarized here
Publish Date:
2023-12-22
Implement Date:
2023-12-30
Scope
Main technical content: This document specifies the general requirements, test methods, and requirements for destructive physical analysis (DPA) of automotive semiconductor discrete devices. It is applicable to the destructive physical analysis of automotive semiconductor discrete devices.
Development Information
Related Standards
GB/T 7288.2-1987
Abolished
GB/T 7288.2-1987 Equipment reliability testing Preferred test conditions Equipment for stationary use in weather protected locations—High degree of simulation
GB/T 7826-1987
Replaced
GB/T 7826-1987 Analysis techniques for system reliability—Procedure for failure mode and effects analysis(FMEA)
GB/T 7827-1987
Abolished
GB/T 7827-1987 Reliability prediction procedure
GB/T 7828-1987
Active
GB/T 7828-1987 Reliability design reviews
GB/T 7829-1987
Active