GB/T 4855-1984
Abolished
GB/T 44937.4-2024
Active
National standards
GB/T 44937.4-2024 Integrated circuits—Measurement of electromagnetic emissions—Part 4:Measurement of conducted emissions—1 Ω/150 Ω direct coupling method
GB/T 44937.4-2024 Integrated circuits—Measurement of electromagnetic emissions—Part 4:Measurement of conducted emissions—1 Ω/150 Ω direct coupling method
Basic Information
Standard Code:
GB/T 44937.4-2024
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2024-12-31
Implement Date:
2024-12-31
Pages:
40 pages
Scope
This document specifies the methods for measuring radio frequency (RF) current directly with a 1 Ω resistive probe and measuring RF voltage with a 150 Ω coupling network to assess the electromagnetic emission (EME) of integrated circuits (ICs). These methods ensure that EME measurements are highly reproducible and reliable.
Development Information
Referenced Standards
IEC 61000-4-6
IEC 61967-1
Adopt standards
IEC 61967-4:2021
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished