DL/T 2813-2024 Active Industry standards-Electricity

DL/T 2813-2024 DL/T 2813-2024 Electric Power Integrated Circuit Electromagnetic Compatibility Test Method

Publish Date: 2024-09-24 Implement Date: 2025-03-24 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: DL/T 2813-2024

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Power testing technology

ICS Name: Integrated circuits, microelectronics

Publish Date: 2024-09-24

Implement Date: 2025-03-24

Scope

This document specifies the test plan for electromagnetic compatibility of power integrated circuits, the emission test method, the immunity test method, and the test report. This document is applicable to the electromagnetic emission and immunity test of power integrated circuits in the frequency range of 150 kHz to 3 GHz.

Development Information

Related Standards

GB/T 4855-1984 Abolished

GB/T 4855-1984 Families and products of linear amplifier for semiconductor integrated circuits

Publish Date: 1984-12-18

GB/T 3434-1986 Abolished

GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits

Publish Date: 1986-04-02

GB/T 3431.2-1986 Active

GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins

Publish Date: 1986-07-01

GB/T 6648-1986 Active

GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories

Publish Date: 1986-07-31

GB/T 6800-1986 Abolished

GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits

Publish Date: 1986-08-28

GB/T 3435-1987 Abolished

GB/T 3435-1987 Series and products for semiconductor CMOS integrated circuits—Products of families 4000

Publish Date: 1987-01-21