T/CSTM 00780.3-2023 Vanadate analysis method - Part 3: Determination of impurity elements containing silicon, aluminum, and 12 other elements by inductively coupled plasma optical emission spectroscopy
T/CSTM 00780.3-2023 Vanadate analysis method - Part 3: Determination of impurity elements containing silicon, aluminum, and 12 other elements by inductively coupled plasma optical emission spectroscopy
Basic Information
Scope
Scope: This document specifies the principles, reagents and samples, instruments and equipment, samples, experimental steps, calculation of analysis results, precision, and test reports for the determination of silicon, aluminum, calcium, iron, lead, manganese, chromium, titanium, arsenic, molybdenum, copper, and phosphorus in sodium vanadate by inductively coupled plasma atomic emission spectrometry. This document is applicable to the determination of the contents of impurity elements such as silicon, aluminum, calcium, iron, lead, manganese, chromium, titanium, arsenic, molybdenum, copper, and phosphorus in sodium vanadate and its solutions. The determination range is shown in Table 1. If the content of any element exceeds the upper limit of the determination range, this document can be referred to for guidance. Main technical content: This document specifies the principles, reagents and samples, instruments and equipment, samples, experimental steps, calculation of analysis results, precision, and test reports for the determination of silicon, aluminum, calcium, iron, lead, manganese, chromium, titanium, arsenic, molybdenum, copper, and phosphorus in sodium vanadate and its solutions. The determination range is shown in Table 1. If the content of any element exceeds the upper limit of the determination range, this document can be referred to for guidance.