DZ/T 0101.12-1994
Active
SJ 2214.8-1982
Abolished
Industry standards-Electronics
SJ 2214.8-1982 Method of measurement for dark current voltage of semiconductor phototransistors
SJ 2214.8-1982 Method of measurement for dark current voltage of semiconductor phototransistors
Price:
$ 30
Basic Information
Standard Code:
SJ 2214.8-1982
Standard Type:
Industry standards
Standard Status:
Abolished
is_force_gb:
no
CCS Name:
Semiconductor photosensitive devices
ICS Name:
-
Publish Date:
1982-11-30
Implement Date:
1983-07-01
Pages:
1 pages
Development Information
Same series standard
SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors
SJ 2214.2-1982 Method of measurement for forward voltage of semiconductor photodiodes
SJ 2214.3-1982 Method of measurement for dark current of semiconductor photodiodes
SJ 2214.4-1982 Method of measurement for reverse break-down voltage of semiconductor photodiodes
SJ 2214.5-1982 Method of measurement for junction capacitance of semiconductor photodiodes
SJ 2214.6-1982 Method of measurement for collector-emitter reverse breakdown voltage of semiconductor phototransistors
SJ 2214.7-1982 Method of measurement for saturation voltage of semiconductor phototransistors
SJ 2214.9-1982 Method of measurement for pulse rise and fall time of semiconductor photodiodes and phototransistors
SJ 2214.10-1982 Method of measurement for light current of semiconductor photodiodes and phototransistors
Superseded by the following standards
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