GB/T 321-1980
Replaced
T/CSP 13-2024
Active
Group standards
T/CSP 13-2024 Particle technology, micro-nano heterogeneous structure analysis, transmission electron microscopy (TEM) method
T/CSP 13-2024 Particle technology, micro-nano heterogeneous structure analysis, transmission electron microscopy (TEM) method
Price:
$ 20.00
Basic Information
Standard Code:
T/CSP 13-2024
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
-
ICS Name:
Integrated Metrology and Measurement
Publish Date:
2024-11-18
Implement Date:
2024-11-25
Scope
Scope: This document describes the methods of measuring and analyzing the morphology, composition, and structure of micro-nano heterogeneous structure samples using transmission electron microscopy, including the principles, instrumentation, sample preparation, and procedures. This document is applicable to micro-nano-scale powder samples and thin film samples with heterogeneous structures, including the analysis of materials with micro-nano heterogeneous structures such as surface modified layers and crystal interfaces. Main technical content: The morphology, structure, composition, and interfaces of micro-nano heterogeneous structures are often closely related to the macroscopic properties of materials, so accurate analysis of various aspects of micro-nano heterogeneous structure samples is particularly important. Transmission electron microscopy is a characterization device that uses electron beams passing through the sample to display the internal morphology and structure of the sample. Equipped with scanning transmission attachments and energy spectroscopy attachments, it can conduct more accurate analysis of the structure and composition of the sample, especially suitable for micro-nano heterogeneous structure samples, which can achieve integrated characterization of the morphology, structure, composition, and interfaces of micro-nano heterogeneous structures. In recent years, with the continuous improvement of the resolution of transmission electron microscopes, the diversification of detectors available, and the improvement of sample preparation techniques, the analysis of micro-nano heterogeneous structure samples using transmission electron microscopes has become more widely applicable and effective.