T/CSTM 01011E-2023 Material dielectric property testing in mmWave band using open-access confocal resonant cavity method
T/CSTM 01011E-2023 Material dielectric property testing in mmWave band using open-access confocal resonant cavity method
Basic Information
Scope
Scope: This document specifies the method of measuring the real part of the relative permittivity and loss tangent of solid dielectrics, composite plates, engineering plastics, and other materials in the frequency range of 20 GHz to 110 GHz using a confocal type open resonator. The measurement range of the real part of the relative permittivity is from 2 to 30, and the measurement range of loss tangent is from 0.0001 to 0.05. Main technical content: This standard is suitable for measuring the real part of the relative permittivity and loss tangent of silicon oxide, aluminum oxide, aluminum nitride, zirconia, boron nitride, silicon carbide, barium titanate, and other inorganic materials, printed circuit boards, and other organic-inorganic composite boards, polytetrafluoroethylene, polystyrene, and other organic engineering plastics. It is also suitable for other similar solid dielectrics, composite plates, engineering plastic materials, and its liquid crystal polymer, modified polyimide, and other thin films.