DZ/T 0101.12-1994
Active
SJ 21347-2018
Active
Industry standards-Electronics
SJ 21347-2018 Cryogenic screening test method for cryogenic device and assembly
SJ 21347-2018 Cryogenic screening test method for cryogenic device and assembly
Price:
$ 30
Basic Information
Standard Code:
SJ 21347-2018
Standard Type:
Industry standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
-
ICS Name:
-
Publish Date:
2018-01-18
Implement Date:
2018-05-01
Pages:
10 pages
Scope
This standard specifies the general and detailed requirements for the screening test methods of low-temperature devices and components at extremely low temperatures. This standard is applicable to the screening test methods of low-temperature devices and components at extremely low temperatures.
Development Information
Referenced Standards
GJB 360B-2009
GJB 451A-2005
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