GB/T 2596-1981
Abolished
GB/T 32281-2015
Active
National standards
GB/T 32281-2015 Test method for measuring oxygen,carbon,boron and phosphorus in solar silicon wafers and feedstock—Secondary ion mass spectrometry
GB/T 32281-2015 Test method for measuring oxygen,carbon,boron and phosphorus in solar silicon wafers and feedstock—Secondary ion mass spectrometry
Basic Information
Standard Code:
GB/T 32281-2015
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Analysis methods for semi-metallic and semiconductor materials
ICS Name:
Chemical analysis of metal materials
Publish Date:
2015-12-10
Implement Date:
2017-01-01
Pages:
8 pages
Development Information
Referenced Standards
ASTM E673
GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 14264-1993 Semiconductor materials—Terms and definitions
GB/T 14264-2009 Semiconductor materials—Terms and definitions
GB/T 14264-2024 Terminology of semiconductor materials
Related Standards
GB/T 3249-1982
Replaced
GB/T 3249-1982 Standard method for determination of particle size of powders of refractory metals and compounds—Fisher method
GB/T 3488-1983
Replaced
GB/T 3488-1983 Hardmetals—metallographic determination of microstructure
GB/T 3489-1983
Replaced
GB/T 3489-1983 Hardmetals—Metallographic determination of porosity and uncombined carbon
GB/T 3651-1983
Replaced
GB/T 3651-1983 Measuring method for thermal conductivity of metal at high temperature
GB/T 4059-1983
Replaced