T/BSPT 6-2024 Granular technology, micro-nano heterogeneous structure analysis, transmission electron microscopy (TEM) method
T/BSPT 6-2024 Granular technology, micro-nano heterogeneous structure analysis, transmission electron microscopy (TEM) method
Basic Information
Scope
Main technical content: The morphology, structure, composition, and interface of micro-nano heterogeneous structures are often closely related to the macroscopic properties of materials, so accurate analysis of various aspects of micro-nano heterogeneous structure samples is particularly important. Transmission electron microscopy is a characterization device that uses electron beams passing through the sample to display the internal morphology and structure of the sample. Equipped with scanning transmission attachments and energy spectroscopy attachments, it can conduct more accurate analysis of the structure and composition of the sample, especially suitable for micro-nano heterogeneous structure samples, allowing integrated characterization of the morphology, structure, composition, and interface of micro-nano heterogeneous structures. In recent years, with the continuous improvement of the resolution of transmission electron microscopes, the diversification of detectors that can be equipped, and the improvement of sample preparation techniques, the analysis of micro-nano heterogeneous structure samples by transmission electron microscopes has become more widely applicable and effective.