T/CEPEA 0203-2023 Active Group standards

T/CEPEA 0203-2023 Automatic ultrasonic scanning testing method for automotive-grade insulated gate bipolar transistor modules

Publish Date: 2025-01-22 Implement Date: 2025-02-15 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: T/CEPEA 0203-2023

Standard Type: Group standards

Standard Status: Active

is_force_gb: no

CCS Name: -

ICS Name: Non-destructive testing

Publish Date: 2025-01-22

Implement Date: 2025-02-15

Scope

Main technical content: This standard defines the terms and definitions, method outline, general requirements, detection preparation, automated detection, detection data processing, detection records and reports, etc. of the fully automatic ultrasonic scanning detection method for automotive-grade insulated gate bipolar transistor modules. This standard is based on the long-term practical experience of the drafting units in the design, manufacture and use of fully automatic ultrasonic scanning detection for automotive-grade insulated gate bipolar transistor modules, and standardizes the fully automatic ultrasonic scanning detection method for automotive-grade insulated gate bipolar transistor modules. This document aims to provide an advanced, reliable, and detailed specification for key detection methods of domestic semiconductors.