GB/T 29309-2012 Accelerated stress testing procedures for electric and electronic products—Guidance for highly accelerated life test
GB/T 29309-2012 Accelerated stress testing procedures for electric and electronic products—Guidance for highly accelerated life test
Basic Information
Scope
This standard specifies the general requirements, test preparation, and test methods for Highly Accelerated Life Testing (HALT).
The HALT specified in this standard applies stresses such as high-temperature step-up, low-temperature step-up, rapid temperature cycling, and six-degree-of-freedom non-Gaussian broadband random vibration.
This standard is applicable to electrical and electronic products and their electronic components, printed circuit board assemblies, etc. For large-scale complete machines, it is recommended to prioritize conducting the test at the assembly level (such as printed circuit board assemblies and sub-modules).
This standard is also applicable to the R&D, design, and/or trial production phases of electrical and electronic products, and can also be used in the mass production phase.