GB/T 36613-2018 Active National standards

GB/T 36613-2018 Probe test method for light emitting diode chips

Publish Date: 2018-09-17 Implement Date: 2019-01-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 36613-2018

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Micro-waves, millimeter-waves, and transistors

ICS Name: Optoelectronics, laser equipment

Publish Date: 2018-09-17

Implement Date: 2019-01-01

Pages: 10 pages

Scope

This standard specifies the optical parameters, DC electrical parameters, and point-test conditions and methods for the sensitivity to electrostatic discharge of light-emitting diode chips (hereinafter referred to as "chips"). This standard applies to the detection methods of mass-produced visible light-emitting diode surface-mount chips and thin-film chips. The point-test of ultraviolet and infrared light-emitting diode chips and epitaxial wafers can also be used for reference. This standard does not apply to the thermal parameters and AC characteristics testing of light-emitting diode chips.