DZ/T 0101.12-1994
Active
YS/T 23-1992
Abolished
Industry standards-Non-ferrous metals
YS/T 23-1992 The method of measuring the thickness of a silicon epitaxial layer using stacking dislocation size
YS/T 23-1992 The method of measuring the thickness of a silicon epitaxial layer using stacking dislocation size
Basic Information
Standard Code:
YS/T 23-1992
Standard Type:
Industry standards
Standard Status:
Abolished
is_force_gb:
no
CCS Name:
-
ICS Name:
-
Publish Date:
1992-03-09
Implement Date:
1993-01-01
Pages:
3 pages
Development Information
Superseded by the following standards
Related Standards
JJG 204-1980
Active
JJG 204-1980 Meteorological Ventilation Psychrometer
SC 53-1980
Active
SC 53-1980 Transfer blade hydraulic steering gear repair quality standard
DZ 4-1981
Replaced
DZ 4-1981
SC 69-1982
Active
SC 69-1982 ZSS-12 Flash-type seawater desalination production device technical specifications
SC 72-1982
Active