SJ 20714-1998 Active Industry standards-Electronics

SJ 20714-1998 Test method for sub-surface damege of gallium arsenide polished wafer by X-ray double crystal diffraction

Publish Date: 1998-03-18 Implement Date: 1998-05-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: SJ 20714-1998

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: -

ICS Name: -

Publish Date: 1998-03-18

Implement Date: 1998-05-01

Pages: 4 pages

Development Information

Pages: 4 pages

Referenced Standards

GJB 1926-1994

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