SJ/T 10627-1995 Abolished Industry standards-Electronics

SJ/T 10627-1995 Test methods for oxygen precipitation characterization of silicon wafers by measurement of interstitial oxygen reduction

Publish Date: 1995-04-22 Implement Date: 1995-10-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: SJ/T 10627-1995

Standard Type: Industry standards

Standard Status: Abolished

is_force_gb: no

CCS Name: Electronic devices and specialized materials, parts, and structural components

ICS Name: \nMetal material testing

Publish Date: 1995-04-22

Implement Date: 1995-10-01

Pages: 5 pages

Development Information

Pages: 5 pages

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