GB/Z 129-2026 Surface chemical analysis—Electron spectroscopies—Measurement of the thickness and composition of nanoparticle coatings
GB/Z 129-2026 Surface chemical analysis—Electron spectroscopies—Measurement of the thickness and composition of nanoparticle coatings
Basic Information
Scope
This document describes the methods used to determine the thickness and chemical composition of the coating layer of "core-shell" nanoparticles (including some variants and non-ideal forms) using electron spectroscopy techniques. It clarifies the assumptions, challenges, and uncertainties of each method. This document also describes the procedures and issues of using electron spectroscopy for routine analysis of nanoparticle samples, particularly their importance in measuring the thickness of the coating layer.
This document focuses on the use of electron spectroscopy techniques, particularly X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and methods based on synchrotron radiation. These methods cannot provide all the information needed for accurate analysis. Therefore, this document outlines some additional analysis methods that, to some extent, help interpret the electron spectroscopy data.