GB/T 4965-1985
Active
GB/T 42706.2-2023
Active
National standards
GB/T 42706.2-2023 Electronic components—Long-term storage of electronic semiconductor devices—Part 2:Deterioration mechanisms
GB/T 42706.2-2023 Electronic components—Long-term storage of electronic semiconductor devices—Part 2:Deterioration mechanisms
Basic Information
Standard Code:
GB/T 42706.2-2023
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
Electronic components comprehensive
Publish Date:
2023-05-23
Implement Date:
2023-09-01
Pages:
15 pages
Scope
This document describes the degradation mechanisms and degradation modes of electronic components under actual storage conditions over time, as well as the test methods for evaluating general degradation mechanisms. This document is typically used in conjunction with IEC 624351 to predict the long-term storage of devices that are stored for more than 12 months. The degradation mechanisms of specific types of electronic components are specified in IEC 624355 to IEC 624359.
Development Information
Same series standard
Referenced Standards
IEC 60749-20-1
Adopt standards
IEC 62435-2:2017
Related Standards
GB/T 5076-1985
Active
GB/T 5076-1985 Measurement of the dimensions of a cylindrical component having two axial terminations
GB/T 5077-1985
Abolished
GB/T 5077-1985 Maximum case dimensions for capacitors and resistors
GB/T 5078-1985
Active
GB/T 5078-1985 Method for the determination of the space required by capacitors and resistors with unidirectional terminations
GB/T 5081-1985
Active
GB/T 5081-1985 Guide for the collection of reliability, availability and maintainability data from field performance of electronic items
GB/T 5839-1986
Active