GB/T 1957-1981
Replaced
T/ZAQ 10113-2022
Active
Group standards
T/ZAQ 10113-2022 Semiconductor device intermittent operation life test equipment
T/ZAQ 10113-2022 Semiconductor device intermittent operation life test equipment
Price:
$ 20.00
Basic Information
Standard Code:
T/ZAQ 10113-2022
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electronic components and information technology
ICS Name:
Measuring instruments and meters
Publish Date:
2022-10-14
Implement Date:
2022-10-20
Scope
Main technical content: This document specifies the terms and definitions, basic parameters, technical requirements, test methods, inspection rules, marking, user manuals, packaging, transportation, and storage of intermittent life test equipment for semiconductor devices (hereinafter referred to as life test equipment)
Development Information
Related Standards
GB/T 1216-1985
Replaced
GB/T 1216-1985 Micrometers
GB/T 5106-1985
Replaced
GB/T 5106-1985 Gauges for straight cylindrical involute splines
GB/T 6091-1985
Replaced
GB/T 6091-1985 Straight edge
GB/T 1217-1986
Replaced
GB/T 1217-1986 Gear tooth micrometers
GB/T 13925-1992
Replaced