GB/T 42789-2023 Active National standards

GB/T 42789-2023 Test method for gloss of silicon wafer

GB/T 42789-2023 Test method for gloss of silicon wafer

Publish Date: 2023-08-06 Implement Date: 2024-03-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 42789-2023
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: \nTest methods for the physical properties of metals
ICS Name: \nMetal material testing
Publish Date: 2023-08-06
Implement Date: 2024-03-01
Pages: 8 pages

Scope

This document describes a method of testing the surface glossiness of silicon wafers using light reflection under geometric conditions of 20°, 60°, or 85°.
This document is suitable for testing the surface glossiness of silicon corrosion wafers, polished wafers, and epitaxial wafers, but it is not suitable for testing silicon wafers with surface patterns.

Development Information

Word Count: 17 Thousand words Pages: 8 pages

Referenced Standards

Related Standards

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