GB/T 4855-1984
Abolished
GB/T 42838-2023
Active
National standards
GB/T 42838-2023 Semiconductor integrated circuits—Measuring method of Holzer circuit
GB/T 42838-2023 Semiconductor integrated circuits—Measuring method of Holzer circuit
Basic Information
Standard Code:
GB/T 42838-2023
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2023-08-06
Implement Date:
2023-12-01
Pages:
13 pages
Scope
This document specifies the test methods for the electrical characteristics of semiconductor integrated circuit Hall circuits (hereinafter referred to as devices). This document is applicable to the testing of the electrical characteristics of semiconductor integrated circuit Hall circuits.
Development Information
Referenced Standards
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished