T/SHPTA 035-2023 Active Group standards

T/SHPTA 035-2023 Flight Time Secondary Ion Mass Spectrometry Testing of Secondary Batteries and Their Key Materials Experimental Methods

T/SHPTA 035-2023 The experimental method for measuring secondary batteries and their critical materials using secondary ion mass spectrometry with time-of-flight secondary ion detection

Publish Date: 2023-01-29 Implement Date: 2023-02-28 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: T/SHPTA 035-2023

Standard Type: Group standards

Standard Status: Active

is_force_gb: no

CCS Name: Material composition analysis instruments and environmental monitoring instruments

ICS Name: Other standards related to electricity and magnetism

Publish Date: 2023-01-29

Implement Date: 2023-02-28

Scope

Scope: This document is applicable to experimental methods related to the testing of secondary batteries and their key materials using time-of-flight secondary ion mass spectrometry. Secondary batteries include, but are not limited to, lithium-ion secondary batteries, lithium polymer batteries, sodium-ion batteries, potassium-ion batteries, magnesium-ion batteries, zinc-ion batteries, nickel-metal hydride batteries, nickel-cadmium batteries, lead-acid batteries, etc. Key materials include cathode materials, anode materials, separator materials, electrolytes, current collectors, etc. Main technical content: This document is only applicable to providing guidance and judgment for time-of-flight secondary ion mass spectrometry testing of secondary batteries and their key materials. According to the different purposes of the test, the samples can be various raw materials, intermediate materials, semi-finished products used for secondary batteries, or various materials or devices extracted from secondary batteries. Depending on the purpose of the test and the presentation of the data, time-of-flight secondary ion mass spectrometry testing is divided into surface mass spectrometry analysis, surface ion imaging (mapping) analysis, and depth profiling analysis.