GB/T 45770-2025 Active National standards

GB/T 45770-2025 Surface chemical analysis—Atomic force microscopy—Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

Publish Date: 2025-06-30 Implement Date: 2026-01-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: GB/T 45770-2025

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Basic standards and general methods

ICS Name: Chemical analysis

Publish Date: 2025-06-30

Implement Date: 2026-01-01

Pages: 28 pages

Scope

This document specifies two methods for characterizing the shape of AFM probes, particularly the handle and near-tip contours. These two methods are achieved by projecting the tip contour of the AFM probe onto a specified plane, or by projecting the characteristics of the probe handle onto that plane under specified operating conditions. Among them, the latter method can demonstrate the effectiveness of the probe in measuring the depth of narrow grooves and similar contour structures. This document is applicable to probes with a radius greater than 5u0, where u0 is the uncertainty in the width of the reference sample ridge structure used to characterize the probe.