GB/T 43063-2023 Active National standards

GB/T 43063-2023 Integrated circuit—Test method for CMOS image sensors

Publish Date: 2023-09-07 Implement Date: 2024-01-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 43063-2023

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Microcircuit

ICS Name: Integrated circuits, microelectronics

Publish Date: 2023-09-07

Implement Date: 2024-01-01

Pages: 32 pages

Scope

This document describes the parameters and testing methods of line-array, area-array, and time-delay integration (TDI) CMOS image sensors (hereinafter referred to as devices) with linear photoelectric response characteristics. This document is applicable to the parameter testing of line-array, area-array, and TDI devices with linear photoelectric response characteristics.

Development Information

Word Count: 64 Thousand words Pages: 32 pages

Related Standards

GB/T 4855-1984 Abolished

GB/T 4855-1984 Families and products of linear amplifier for semiconductor integrated circuits

Publish Date: 1984-12-18

GB/T 3434-1986 Abolished

GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits

Publish Date: 1986-04-02

GB/T 3431.2-1986 Active

GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins

Publish Date: 1986-07-01

GB/T 6648-1986 Active

GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories

Publish Date: 1986-07-31

GB/T 6800-1986 Abolished

GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits

Publish Date: 1986-08-28

GB/T 3435-1987 Abolished

GB/T 3435-1987 Series and products for semiconductor CMOS integrated circuits—Products of families 4000

Publish Date: 1987-01-21