GB/T 4589.1-2006 Active National standards

GB/T 4589.1-2006 Semiconductor devices—Part 10:Generic specification for discrete devices and integrated circuits

Publish Date: 2006-10-10 Implement Date: 2007-02-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 4589.1-2006

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor discrete devices

ICS Name: Integrated Components of Semiconductor Devices

Publish Date: 2006-10-10

Implement Date: 2007-02-01

Pages: 34 pages

Scope

This specification forms part of the International Electrotechnical Commission's Electronic Component Quality Assessment System (IECQ). This specification is a general standard for semiconductor devices (discrete devices and integrated circuits, including multi-chip integrated circuits, but excluding hybrid circuits). This specification defines the general procedures for quality assessment adopted within the IECQ system and provides general principles for the following aspects: — Electrical characteristics testing methods; — Climate and mechanical testing; — Durability testing. Note: When there are approved sub-specifications, family specifications, and blank detailed specifications applicable to a specific type or types of devices, these specifications must be used to supplement this specification.