T/ZSA 47-2020 Abolished Group standards

T/ZSA 47-2020 Test method for reliability of power semiconductor devices used in electric vehicles

Publish Date: 2020-12-06 Implement Date: 2020-12-07 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: T/ZSA 47-2020

Standard Type: Group standards

Standard Status: Abolished

is_force_gb: no

CCS Name: Electronic components and information technology

ICS Name: Integrated Components of Semiconductor Devices

Publish Date: 2020-12-06

Implement Date: 2020-12-07

Scope

Scope: This document specifies the functional inspection requirements, reliability test requirements, and test methods for power semiconductor devices used in electric vehicles. It also stipulates the special test requirements for wide bandgap power semiconductor devices used in vehicles. This document applies to non-insulated power semiconductor devices and insulated power semiconductor modules, including but not limited to insulated gate bipolar transistors, metal-oxide field-effect transistors, and diode devices and modules. This document provides guidelines for conducting reliability type tests and reliability design and inspection of power semiconductor devices used in electric vehicles. Main technical content: This document specifies the functional inspection requirements, reliability test requirements, and test methods for power semiconductor devices used in electric vehicles. It also stipulates the special test requirements for wide bandgap power semiconductor devices used in vehicles. This document applies to non-insulated power semiconductor devices and insulated power semiconductor modules, including but not limited to insulated gate bipolar transistors, metal-oxide field-effect transistors, and diode devices and modules. This document provides guidelines for conducting reliability type tests and reliability design and inspection of power semiconductor devices used in electric vehicles.