JJF 1029-2024 Technical Requirements for Production of Electron Probe Quantitative Analysis Reference Materials

JJF 1029-1991

JJF 1005-2016 General Terms and Definitions Used in Connection with Reference Materials JJF 1059.1-2012 Evaluation and Expression of Uncertainty in Measurement JJF 1186-2007 The Rules for Drafting of Contents for Certificates and Labels of Certified Reference Materials JJF 1186-2018 Requirements of Reference Materials Certificates and Labels JJF 1342-2012 General Requirements for Reference Material Producers JJF 1342-2022 General Requirements for the Competence of Reference Material Producers JJF 1343-2012 General and Statistical Principles for Characterization of Reference Materials JJF 1343-2022 Characterization,Homogeneity and Stability Assessment of Reference Materials JJF 1646-2017 The Production of Reference Materials for Geoanalysis JJF 1854-2020 Metrological Technical Specification for Establishment,Evaluation and Expression for Metrological Traceability of Reference Materials GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry GB/T 21636-2008 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis(EPMA)—Vocabulary GB/T 28634-2012 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy GB/T 20725-2025 Microbeam analysis—Electron probe microanalysis—Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry GB/T 28634-2025 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy