GB/Z 107-2025 Active National standards

GB/Z 107-2025 Semiconductor devices—Scan based ageing level estimation for semiconductor devices

Publish Date: 2025-12-03 Implement Date: 1970-01-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: GB/Z 107-2025

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor discrete devices

ICS Name: Integrated Components of Semiconductor Devices

Publish Date: 2025-12-03

Implement Date: 1970-01-01

Pages: 16 pages

Scope

This document provides a design technique for evaluating the performance of storage units and a method of using this performance evaluation storage unit to assess the level of degradation.
This document is suitable for monitoring the degradation state and assessing the level of degradation of semiconductor devices. Assessing the level of degradation of semiconductor devices can help improve system reliability.