DB51/T 3207-2024 Active Sichuan ProvinceLocal standards

DB51/T 3207-2024 Microwave Probe Application Specification for Integrated Circuit Test

Publish Date: 2024-12-03 Implement Date: 2024-12-29 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: DB51/T 3207-2024

Standard Type: Local standards

Standard Status: Active

is_force_gb: no

CCS Name: General electronic measuring instruments, equipment, and systems

ICS Name: Electronics, magnetism, and the measurement of electricity and magnetism.

Publish Date: 2024-12-03

Implement Date: 2024-12-29

Publisher: 四川省市场监督管理局

Technical Committee: 四川省经济和信息化厅

Scope

本文件规定了集成电路测试用微波探针（以下简称“探针”）的分类、应用要求、故障判定、推荐指数、维护需求等。本文件适用于微波集成电路中测试微波探针的选用。

Development Information

Drafting Units:

中国电子科技集团公司第九研究所

Drafting Persons:

刘福涵、冯楠轩、王慧丽、张芦、高春燕、丁敬垒、李晓宇、张志红、高晓琴、肖佳琪

Related Standards

GB/T 10406.1-1989 Abolished

GB/T 10406.1-1989 Specification for three-component borehole magnetometer

Publish Date: 1989-02-21

GB/T 10407-1989 Abolished

GB/T 10407-1989 General purpose specification of filar suspension magnetometer

Publish Date: 1989-02-22

GB/T 12190-1990 Replaced

GB/T 12190-1990 Measurement of shielding effectiveness of high-performance shielding enclosures

Publish Date: 1990-02-01

GB/T 13637-1992 Replaced

GB/T 13637-1992 DDZ-Ⅲ series process electronic control system—Indicating instrument

Publish Date: 1992-08-29

GB/T 3408-1994 Replaced

GB/T 3408-1994 Unbonded elastic wire resistance type strain meter

Publish Date: 1994-12-22

GB/T 3409-1994 Replaced

GB/T 3409-1994 Unbonded elastic wire resistance type reinforced concrete meter

Publish Date: 1994-12-22