PDF
GB/T 31854-2015 Active
GB/T 31854-2015 Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry
Abstract
This standard specifies the method for determining the content of trace metallic impurities in silicon materials for photovoltaic cells using inductively coupled plasma mass spectrometers (ICP-MS).
This standard is applicable to the determination of the content of trace metallic impurities such as iron, chromium, nickel, copper, and zinc in silicon materials for photovoltaic cells. The measurement ranges for each element are shown in Table 1.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 31854-2015 |
| CCS | Element semiconductor materials |
| ICS | Semiconductor materials |
| Implement Date | 2016-03-01 |
Price
$ 50
Subtotal
$ 50
Tax
$ 0.00
Order Total (incl. tax)
$ 50