GB/T 4937.11-2018 Active
GB/T 4937.11-2018 Semiconductor devices—Mechanical and climatic test methods—Part 11:Rapid change of temperature—Two-fluid-bath method
Abstract
This part of GB/T 4937 specifies the test method for rapid temperature change - double liquid tank method. When device qualification can be carried out using either air-air temperature cycling or rapid temperature change - double liquid tank method, air-air temperature cycling test shall be preferred. This test can also be used to simulate the impact of cleaning device's heating liquid on the device by conducting a small number of cycles (5 to 10 times). This test is applicable to all semiconductor devices. Unless otherwise specified in relevant specifications, this test is considered destructive. This test is basically consistent with GB/T 2423.22-2002, but in view of the special requirements of semiconductor devices, the provisions of this part are adopted.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.11-2018 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2019-01-01 |