GB/T 4937.18-2018 Active
GB/T 4937.18-2018 Semiconductor devices—Mechanical and climatic test methods—Part 18:Ionizing radiation(total dose)
Abstract
This part of GB/T 4937 provides a test procedure for the total dose of ionizing radiation from 60Co γ-ray sources on packaged semiconductor integrated circuits and semiconductor discrete devices. This part provides an accelerated annealing test method to evaluate the effects of low-dose-rate ionizing radiation on devices. This annealing test is particularly important for applications involving low-dose-rate radiation or devices that exhibit time-dependent effects in certain application scenarios. This part is only applicable to steady-state irradiation and is not suitable for pulse-type irradiation. This part is mainly aimed at military or space-related applications. This test may cause serious degradation of the electrical performance of irradiated devices, and is therefore considered a destructive test.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.18-2018 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2019-01-01 |