PDF
GB/T 30857-2014 Active
GB/T 30857-2014 Standard test method for thickness and thickness variation on sapphire substrates
Abstract
This standard specifies the test method for determining whether the thickness and thickness variation of sapphire single-crystal cutting wafers, grinding wafers, and polishing wafers (referred to as substrate wafers) prepared for gallium nitride thin-film epitaxial wafers and other applications meet the standard limit requirements.
This standard is applicable to the testing of the thickness and thickness variation of sapphire substrate wafers.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 30857-2014 |
| CCS | \nTest methods for the physical properties of metals |
| ICS | \nMetal material testing |
| Implement Date | 2015-04-01 |
Price
$ 28.00
Subtotal
$ 28.00
Tax
$ 0.00
Order Total (incl. tax)
$ 28.00