GB/T 30857-2014 Active National standards

GB/T 30857-2014 Standard test method for thickness and thickness variation on sapphire substrates

Publish Date: 2014-07-24 Implement Date: 2015-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 30857-2014

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: \nTest methods for the physical properties of metals

ICS Name: \nMetal material testing

Publish Date: 2014-07-24

Implement Date: 2015-04-01

Pages: 5 pages

Scope

This standard specifies the test method for determining whether the thickness and thickness variation of sapphire single-crystal cutting wafers, grinding wafers, and polishing wafers (referred to as substrate wafers) prepared for gallium nitride thin-film epitaxial wafers and other applications meet the standard limit requirements.
This standard is applicable to the testing of the thickness and thickness variation of sapphire substrate wafers.