PDF

GB/T 30868-2014

GB/T 30868-2014 Test method for measuring micropipe density of monocrystalline silicon carbide wafers—Chemically etching

Available format(s)
PDF
Language(s)
Chinese
Publish Date
2014-07-24

Abstract

This standard specifies the method of determining the density of silicon carbide single-crystal microtubes using the corrosion method with molten potassium hydroxide.
This standard is applicable to the determination of the density of silicon carbide single-crystal microtubes.

General Product Information

Document Type National standards
Standard Status Replaced
Standard Code GB/T 30868-2014
CCS Compound semiconductor materials
ICS Semiconductor materials
Implement Date 2015-02-01
Price $ 36
Subtotal $ 36
Tax $ 0.00
Order Total (incl. tax) $ 36

Log In

Contact Us