GB/T 4937.27-2023 Active
GB/T 4937.27-2023 Semiconductor devices—Mechanical and climatic test methods—Part 27:Electrostatic discharge (ESD) sensitivity testing—Machine model (MM)
Abstract
This document establishes standard procedures for ESD testing and classification of semiconductor devices based on their sensitivity to damage or degradation caused by ESD in accordance with the specified machine model (MM). This document is used as an optional testing method compared to the human body model ESD, with the aim of providing reliable and repeatable ESD test results for accurate classification. This document is applicable to semiconductor devices and belongs to destructive testing. The ESD testing of semiconductor devices is selected from this document, the human body model (HBM, see GB/T 4937.26), or other testing methods in the GB/T 4937 series. The results of MM and HBM testing are similar but not identical. Unless otherwise specified, the HBM testing method is the selected method.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.27-2023 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2023-12-01 |