GB/T 4937.27-2023 Active National standards

GB/T 4937.27-2023 Semiconductor devices—Mechanical and climatic test methods—Part 27:Electrostatic discharge (ESD) sensitivity testing—Machine model (MM)

Publish Date: 2023-05-23 Implement Date: 2023-12-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: GB/T 4937.27-2023

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor discrete devices

ICS Name: Integrated Components of Semiconductor Devices

Publish Date: 2023-05-23

Implement Date: 2023-12-01

Pages: 13 pages

Scope

This document establishes standard procedures for ESD testing and classification of semiconductor devices based on their sensitivity to damage or degradation caused by ESD in accordance with the specified machine model (MM). This document is used as an optional testing method compared to the human body model ESD, with the aim of providing reliable and repeatable ESD test results for accurate classification. This document is applicable to semiconductor devices and belongs to destructive testing. The ESD testing of semiconductor devices is selected from this document, the human body model (HBM, see GB/T 4937.26), or other testing methods in the GB/T 4937 series. The results of MM and HBM testing are similar but not identical. Unless otherwise specified, the HBM testing method is the selected method.