GB/T 14264-1993
Replaced
GB/T 4937.27-2023
Active
National standards
GB/T 4937.27-2023 Semiconductor devices—Mechanical and climatic test methods—Part 27:Electrostatic discharge (ESD) sensitivity testing—Machine model (MM)
GB/T 4937.27-2023 Semiconductor devices—Mechanical and climatic test methods—Part 27:Electrostatic discharge (ESD) sensitivity testing—Machine model (MM)
Basic Information
Standard Code:
GB/T 4937.27-2023
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
Integrated Components of Semiconductor Devices
Publish Date:
2023-05-23
Implement Date:
2023-12-01
Publisher:
国家市场监督管理总局、国家标准化管理委员会
Technical Committee:
全国半导体器件标准化技术委员会(SAC/TC 78)
Pages:
13 pages
Scope
本文件依据半导体器件对规定的机器模型(MM)静电放电(ESD)所造成损伤或退化的敏感度，建立了半导体器件ESD测试和分级的标准程序。本文件相对于人体模型ESD，用作一种可选的测试方法，目的是提供可靠、可重复的ESD测试结果，以此进行准确分级。本文件适用于半导体器件，属于破坏性试验。半导体器件的ESD测试从本文件、人体模型(HBM见GB/T 4937.26)或GB/T 4937系列中的其他测试方法中选择。MM与HBM测试的结果相似但不完全相同。除另有规定外，HBM测试方法为所选方法。
Development Information
Drafting Units:
中国电子科技集团公司第十三研究所、河北北芯半导体科技有限公司、安徽高芯众科半导体有限公司、武汉格物芯科技有限公司、河北中电科航检测技术服务有限公司、佛山市川东磁电股份有限公司、广东省中绍宣标准化技术研究院有限公司
Drafting Persons:
迟雷、高金环、高蕾、辛长林、彭浩、张瑞霞、黄杰、何黎、赵鹏、魏兵、刘洪刚、颜天宝、王介
Same series standard
GB/T 4937.23-2023 Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life
GB/T 4937.26-2023 Semiconductor devices—Mechanical and climate test methods—Part 26:Electrostatic discharge(ESD)sensitivity testing—Human body model(HBM)
GB/T 4937.31-2023 Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devices(internally induced)
GB/T 4937.32-2023 Semiconductor devices—Mechanical and climatic test methods—Part 32:Flammability of platic-encapsulated devices(externally induced)
GB/T 4937.42-2023 Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage
Adopt standards
IEC 60749-27:2012
Related Standards
GB/T 14844-1993
Replaced
GB/T 14844-1993 Designations of semiconductor materials
GB/T 17573-1998
Active
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General
GB/T 12560-1999
Active
GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices
GB/T 11499-2001
Active
GB/T 11499-2001 Letter symbols for discrete semiconductor devices
GB/T 20521-2006
Active