DB35/T 1370-2013 Active Fujian ProvinceLocal standards

\nDB35/T 1370-2013 Method for Spot Measurement of LED Chips

DB35/T 1370-2013

Publish Date: 2013-12-04 Implement Date: 2014-03-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: DB35/T 1370-2013

Standard Type: Local standards

Standard Status: Active

is_force_gb: no

CCS Name: Micro-waves, millimeter-waves, and transistors

ICS Name: Optoelectronics, laser equipment

Publish Date: 2013-12-04

Implement Date: 2014-03-01

Pages: 12 pages

Scope

This standard specifies the spot-test conditions and methods for light-emitting diode chips (hereinafter referred to as chips). This standard is applicable to the spot-test of optical parameters, DC electrical parameters, and electrostatic discharge sensitivity of visible light-emitting diode chips. The spot-test of ultraviolet and infrared light-emitting diode chips and epitaxial wafers can also be used for reference. This standard is not applicable to the thermal parameters and AC characteristics tests of light-emitting diode chips.