SJ/T 11845.3-2022 Active Industry standards-Electronics

SJ/T 11845.3-2022 Low-frequency noise parameter-based reliability evaluation method for electronic components Part 3: Diodes. (English translation only)

Publish Date: 2022-10-20 Implement Date: 2023-01-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: SJ/T 11845.3-2022

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor diode

ICS Name: Diode

Publish Date: 2022-10-20

Implement Date: 2023-01-01

Development Information

Same series standard

SJ/T 11845.1-2022 Method for evaluating the reliability of electronic components based on low-frequency noise parameters - Part 1: General requirements SJ/T 11845.2-2022 Electronic Component Reliability Evaluation Method Based on Low-frequency Noise Parameters - Part 2: Optoelectronic Coupling Devices

Related Standards

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GB/T 15137-1994 Abolished

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