GB/Z 119-2026 Active National standards

GB/Z 119-2026 C-Si photovoltaic(PV) modules—Light and elevated temperature induced degradation(LETID) test—Detection

GB/Z 119-2026 C-Si photovoltaic(PV) modules—Light and elevated temperature induced degradation(LETID) test—Detection

Publish Date: 2026-01-04 Implement Date: 1970-01-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: GB/Z 119-2026
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: Physical power supply
ICS Name: Solar energy engineering
Publish Date: 2026-01-04
Implement Date: 1970-01-01
Pages: 16 pages

Scope

This document describes the test method for light-heat-induced degradation (LETID) of crystalline silicon photovoltaic modules, including instrument setup, sample preparation, test procedures, data processing, and report content.
This document is applicable to crystalline silicon photovoltaic modules and is used to reveal the sensitivity of the samples to the LETID degradation mechanism, but it cannot accurately measure the actual degradation in outdoor environments. The extent and time scale of outdoor degradation depend on the local climate and module technology.

Development Information

Word Count: 17 Thousand words Pages: 16 pages

Referenced Standards

Adopt standards

IEC TS 63342:2022

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