GB/T 14264-1993
Replaced
T/UNP 734-2025
Active
Group standards
T/UNP 734-2025 Test Method for Semiconductor Thermoelectric Generator (TEG) Devices
T/UNP 734-2025
Price:
$ 20.00
Basic Information
Standard Code:
T/UNP 734-2025
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
-
ICS Name:
Integrated Components of Semiconductor Devices
Publish Date:
2025-06-18
Implement Date:
2025-06-18
Scope
Main technical content: This standard focuses on the reliability testing of semiconductor thermoelectric generator (TEG) devices, covering mechanical stress tests, climatic environment tests, and service life tests. Mechanical stress tests include mechanical shock, vibration, and shear resistance to assess the device's structural strength. Climatic environment tests involve high temperature, thermal shock, etc. to evaluate environmental adaptability. The service life test estimates the device's lifespan based on the Arrhenius equation. Each test specifies the principle, equipment, procedures, and result calculation/evaluation methods, suitable for reliability testing of such devices to ensure stable performance under various conditions.
Development Information
Related Standards
GB/T 14844-1993
Replaced
GB/T 14844-1993 Designations of semiconductor materials
GB/T 17573-1998
Active
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General
GB/T 12560-1999
Active
GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices
GB/T 11499-2001
Active
GB/T 11499-2001 Letter symbols for discrete semiconductor devices
GB/T 20521-2006
Active