T/ZZB Q063-2022 Active Group standards

T/ZZB Q063-2022 Semiconductor device intermittent operation life test equipment

Publish Date: 2022-10-14 Implement Date: 2022-10-20 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: T/ZZB Q063-2022

Standard Type: Group standards

Standard Status: Active

is_force_gb: no

CCS Name: Electronic test instruments and equipment

ICS Name: Measuring instruments and meters

Publish Date: 2022-10-14

Implement Date: 2022-10-20

Scope

Main technical content: This document specifies the terms and definitions, basic parameters, technical requirements, test methods, inspection rules, marking, user manuals, packaging, transportation, and storage of intermittent life test equipment for semiconductor devices (hereinafter referred to as life test equipment). This document is applicable to verifying the service life of semiconductor power devices such as diodes, transistors, SCRs, MOSFETs, and IGBTs encapsulated with any materials of Si, GaN, and SiC, and conducting accelerated failure analysis of intermittent life test equipment.