T/EDASQUARE 005-2023 Active Group standards

T/EDASQUARE 005-2023 Wafer-level electrical parameter testing data format

Publish Date: 2023-09-10 Implement Date: 2023-09-10 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: T/EDASQUARE 005-2023

Standard Type: Group standards

Standard Status: Active

is_force_gb: no

CCS Name: -

ICS Name: Integrated circuits, microelectronics

Publish Date: 2023-09-10

Implement Date: 2023-09-10

Scope

Main technical content: This document specifies the parameter electrical test data files in the manufacturing of semiconductor integrated circuits, and defines the data format, data framework structure, data type, and data item settings in the file, which is applicable to the parameter electrical test data involved in manufacturing-type electronic automation design software. The main contents include: the syntax of the data file, the framework structure, the data file format including the data header, version information, data type, application type, user information, product information, product batch information, test environment information, model information, working mode information, device information, detection information, location information, structural geometric information, test information, parameter information, security information, integrity check information, test data content, statistical information of single test items, overall test total statistical information, application requirements, and the form of the data file, etc.

Development Information

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