T/CSA 047-2019 Active Group standards

The test method for thermal resistance of light-emitting diodes specified in T/CSA 047-2019

T/CSA 047-2019

Publish Date: 2019-12-30 Implement Date: 2019-12-30 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: T/CSA 047-2019
Standard Type: Group standards
Standard Status: Active
is_force_gb: no
CCS Name: Semiconductor diode
ICS Name: Other standards related to lighting
Publish Date: 2019-12-30
Implement Date: 2019-12-30

Scope

Scope: This standard specifies an electrical method for thermal resistance testing of light-emitting diodes (LEDs) or LED arrays. This standard applies to LEDs powered by direct current and under the condition of no self-heating. The forward voltage of the tested LEDs should exhibit a clear linear relationship with the ambient temperature. This standard is suitable for testing the thermal resistance and junction temperature of LEDs in steady-state and transient conditions in laboratory environments and small batches of single LEDs and LED arrays of certain structures (including series, parallel, and mixed connections of LEDs). This standard is not applicable to the thermal resistance and junction temperature testing of laser diodes. Main technical contents: This standard specifies an electrical method for thermal resistance testing of light-emitting diodes (LEDs) or LED arrays. This standard applies to LEDs powered by direct current and under the condition of no self-heating. The forward voltage of the tested LEDs should exhibit a clear linear relationship with the ambient temperature. This standard is suitable for testing the thermal resistance and junction temperature of LEDs in steady-state and transient conditions in laboratory environments and small batches of single LEDs and LED arrays of certain structures (including series, parallel, and mixed connections of LEDs). This standard is not applicable to the thermal resistance and junction temperature testing of laser diodes.

Development Information

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