GB/T 5295-1985
Replaced
T/YGAZXH 1-2024
Active
Group standards
T/YGAZXH 1-2024 The observation and grading method of internal grain patterns on lithium niobate wafers
T/YGAZXH 1-2024 The observation and grading method of internal grain patterns on lithium niobate wafers
Price:
$ 20.00
Basic Information
Standard Code:
T/YGAZXH 1-2024
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electronic components and information technology
ICS Name:
Optoelectronics, laser equipment
Publish Date:
2024-09-26
Implement Date:
2024-11-01
Scope
Main technical content: This document describes the method of observing and grading the internal vein stripes of lithium niobate wafers using shadowgraphy. This document is suitable for the observation and grading of internal vein stripes in lithium niobate wafers.
Development Information
Related Standards
GB/T 7257-1987
Replaced
GB/T 7257-1987 Measurement methods of parameter for helium neon laser
GB/T 7270-1987
Replaced
GB/T 7270-1987 Methods of measurement for photomultiplier tubes
GB/T 7271-1987
Abolished
GB/T 7271-1987 Methods of measurement for phototubes
GB/T 12082-1989
Active
GB/T 12082-1989 Letter symbols for gas lasers
GB/T 12083-1989
Replaced