GB/T 46788-2025 Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
GB/T 46788-2025 Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
Basic Information
Scope
This document specifies the environmental acceptance tests for tin-based plating on the surface of semiconductor devices and methods to retard the growth of tin whiskers. This method may not meet the requirements of specific applications (such as military and aerospace), and supplementary requirements may be specified in appropriate specifications or procurement documents.
This document is not applicable to semiconductor devices with only bottom lead-out terminals (such as square flat leadless and ball grid array devices, flip-chip bump lead-out terminals), as all the plated surfaces of the lead-out terminals of such devices will be immersed during the assembly process.
When using this document, the reporting requirements in Chapter 7 must also be met.