T/ZSA 47-2020 Test method for reliability of power semiconductor devices used in electric vehicles
T/ZSA 47-2020 Test method for reliability of power semiconductor devices used in electric vehicles
Basic Information
Scope
Scope: This document specifies the functional inspection requirements, reliability test requirements, and test methods for power semiconductor devices used in electric vehicles. It also stipulates the special test requirements for wide bandgap power semiconductor devices used in vehicles. This document applies to non-insulated power semiconductor devices and insulated power semiconductor modules, including but not limited to insulated gate bipolar transistors, metal-oxide field-effect transistors, and diode devices and modules. This document provides guidelines for conducting reliability type tests and reliability design and inspection of power semiconductor devices used in electric vehicles. Main technical content: This document specifies the functional inspection requirements, reliability test requirements, and test methods for power semiconductor devices used in electric vehicles. It also stipulates the special test requirements for wide bandgap power semiconductor devices used in vehicles. This document applies to non-insulated power semiconductor devices and insulated power semiconductor modules, including but not limited to insulated gate bipolar transistors, metal-oxide field-effect transistors, and diode devices and modules. This document provides guidelines for conducting reliability type tests and reliability design and inspection of power semiconductor devices used in electric vehicles.